AZoM on MSN

Environmental Test Conditions and Their Impact on Semiconductor Failure Analysis

When accelerated testing reveals failures, what do they really mean? Understanding stress-induced artefacts in semiconductor ...
EDN

Accel-RF system tests reliability of GaN devices

Joining a family of RF reliability test systems is the HiPR-AARTS (High Power RF Automated Accelerated Reliability Test System) from Accel-RF, intended to help manufacturers prove the reliability of ...
UMass Lowell

Development of Accelerated Aging Test Protocol for Environmental

Electrical devices operate under harsh conditions and high temperatures, requiring coatings or hermetically sealed packaging to protect them. Hermetic packaging is not ideal due to their high cost and ...
Electronic Design

Test System Supplier Helps Implement Accelerated Testing

The Direct Customer Advantage Program from QualMark Corp., Denver, Colo., offers on-line access to timely information to support accelerated reliability testing programs. Through the program, ...