Researchers have discovered a novel way to manipulate defects in semiconductors. The study holds promising opportunities for novel forms of precision sensing, or the transfer of quantum information ...

Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.

Schematic diagram of the method for directly visualizing defects in 2D semiconductors. (Courtesy: G Zhang) Directly visualizing structural defects in semiconductors on large scales is no easy task.

Description: Structures and interactions of point, line, and planar defects in solids, with emphasis on properties of defects. Generic basis of defect energies and interactions, with reference to ...