Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

Today's chip designs are getting smaller and bigger. Feature sizes are moving into nanometer geometries, and gate counts are pushing towards the 100M gate mark. Semiconductor companies creating these ...

New semiconductor technologies like FinFETs are giving rise to new types of fault effects not covered by standard stuck-at and at-speed tests. Automatic test pattern generation (ATPG) tools perform ...

There is a rapidly growing interest in the use of structural techniques for testing random logic. In particular, much has been published on new techniques for on-chip compression of automatic test ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

The current shift in the test methodologies is away from the ubiquitous single stuck-at fault model. The best test for any device is to exhaustively test the device. The quality of such a test would ...