Electronics360

Three big semiconductor test probe challenges

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing ...
Digi Times

Hermes Testing expands probe solution business amid AI-driven semiconductor demand

Hermes Testing, a testing solutions provider under Hermes Epitek, is leveraging its machine engineering services and customized equipment manufacturing to address growing demand in advanced ...
Business Insider

New SmartMatrix™ 3000XP Probe Card Lowers DRAM Test Costs by More than 25%

LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ:FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe ...
Semiconductor Engineering

Using Test And Metrology Data For Dynamic Process Control

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
Nasdaq

Keysight Enables Dynamic Test on a Wide-Bandgap Power Semiconductor Bare Chip

Easily and accurately measure dynamic characteristics on a Wide-Bandgap power semiconductor bare chip without soldering or probe needles Keysight fixture enables quick, repeated test without damaging ...
Digi Times

Tanaka develops rhodium probe pin material for semiconductor testing

Tanaka Precious Metal Technologies has developed TK-SR, a rhodium-based material for probe pins used in probe cards during semiconductor front-end testing. Save my User ID and Password Some ...